Hitachi S-800 Scanning Electron Microscope: semhitachi
Versatile SEM for top view and cross-sectional imaging of a wide variety of samples and substrates. The semhitachi is located outside the cleanroom and used for end-of-line analysis of wafer pieces and chips. (Please note that there is a two-hour limit on reservation length on this tool during prime time [8 am - 6 pm, Monday through Friday].)

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Stanford Nanofabrication Facility
Last Modified 07/11/2006