| Equipment Name | Primary Etched Material | Standard Recipes | Gases Available | Wafer Size | Max. Load
(wf) |
| Applied P5000 | Aluminum, oxide, poly | Aluminum | Ar, BCl3, CF4, C4F8, CH3, Cl2, N2, O2, SF6 | 4" | 4 |
| Amtetcher | Oxide | Oxide:Thermal, LTO, Via Etch, Planerization, Nitride, Polymer Clean | O2, CHF3, SF6, Ar, NF3 | 4" | 24 |
| Drytek1 | Poly, Nitride | Isotropic Poly, Anisotropic Poly, Nitride, Si Trench, TiW, Resist Harden, Descum | O2, CF4, SF6, C2ClF5, CBrF3 | 4" | 1 |
| Drytek2 | Poly, Nitride | Isotropic Poly, Anisotropic Poly, Nitride, Si Trench, TiW, Resist Harden, Descum | O2, CF4, SF6, C2ClF5, CBrF3 | 4" | 6 |
| Drytek4 | Oxide and nitride on GaAs | Oxide, nitride | O2, CF4, CHF3, Ar, C2ClF5, CBrF3 | 4" - 6" | 1 |
| LamPoly | Poly, Shallow Si | Poly, Shallow Si, Trench | Ar, N2, O2, 20% O2 in He, CF4, C2F6, HBr, SF6 | 4" | 25 |
| Matrix | Photoresist | Resist | O2 | 3" or 4" | 25 |
| MRC Etcher | Miscellaneous | Miscellaneous | O2, CF4, SF6, Freon115, Ar | 4" - 6" | 1 |
| PlasmaQuest | GaAs | GaAs | Ar, N2, O2, CF4, Cl2, CH4, He, H2, SF6, BCl3, SiH4 | 4" | 1 |
| STS DRIE etch | Deep Silicon | Deep Si Shallow Si | Ar, C4F8, O2, N2, SF6 | 4" | 1 |
Note:
Some of the above listed equipment may have materials
policies and/or restrictions that prohibit use of other equipment .
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Stanford Nanofabrication Facility webmaster@snf.stanford.edu Last Modified 08/29/2003 |