These etch rates were performed at SNF on films that
were processed here. Etch rates are listed in units of angstroms per minute
and represent only approximate values. Note that etch rates are dependent on
etchant temperature, age, and history, as well as conditions of film growth
or deposition.
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| Thermal Oxide |
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| LTO Undensified |
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| 4% Undensified |
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| 8% Undensified |
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| LTO Densified |
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| 4% Densified |
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| 8% Densified |
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| Std Nitride |
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| Low Stress Nitride |
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| Undoped Poly |
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*For the Nitride wafers, when a 1600A stress sample was used 68A were stripped off in the first minute and 4A after that. However, when a 300A sample was used, 8A were removed in the first minute and each additional minute thereafter.
**Low Stress Nitride in Pad etch 337A in the first minute and 4A thereafter.
***Hot Phosphorus was 152C
****Aluminum Etch was 40C
(a)Correction by Brian Greene
6/14/01
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Stanford Nanofabrication Facility Last Modified 08/29/2003 |