Wet Etch rates for Various Non-Metal Films


These etch rates were performed at SNF on films that were processed here. Etch rates are listed in units of angstroms per minute and represent only approximate values. Note that etch rates are dependent on etchant temperature, age, and history, as well as conditions of film growth or deposition.

 
6:1 Buff HF
20:1 Buff HF
50:1 HF
10:1 HF
Hot Phos.
H2O2
Al etch
Pad Etch
Freckle Etch
Thermal Oxide
910
300
50
280
<10
---
<10
385
73
LTO Undensified
2900
740
300(a)
920
<10
---
<10
2370
459
4% Undensified
4340
1000
350
2000
16
---
<10
4278
2530
8% Undensified
6000
1650
600
3300
30
---
<10
5561
2970
LTO Densified
1400
400
87
715
<10
---
<10
642
91
4% Densified
1625
490
90
1460
<10
---
---
1560
1355
8% Densified
2900
725
290
1500
<10
---
<10
3120
2385
Std Nitride
<10
<10
<10
36
35
---
---
*
43
Low Stress Nitride
<10
<10
<10
40
32
---
---
**
148
Undoped Poly
---
---
---
---
<10
---
<10
---
265

*For the Nitride wafers, when a 1600A stress sample was used 68A were stripped off in the first minute and 4A after that. However, when a 300A sample was used, 8A were removed in the first minute and each additional minute thereafter.

**Low Stress Nitride in Pad etch 337A in the first minute and 4A thereafter.

***Hot Phosphorus was 152C

****Aluminum Etch was 40C

(a)Correction by Brian Greene 6/14/01


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Stanford Nanofabrication Facility
Last Modified 08/29/2003